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Brand Name : MICRO ACCURACY
Model Number : SPC500
Certification : CE ISO SGS
Place of Origin : china
MOQ : 1 Piece
Price : negotiation
Payment Terms : L/C, T/T, Western Union, MoneyGram
Supply Ability : 50, 000PCS/Year
Packaging Details : Standard exporting package
Travel-X.Y Axis : 500*400(mm)
Travel-Z Axis : 200mm
Z-Axis Working Range : 108mm
XY Feed Mechanism : Manual
Z Feed Mechanism : CNC
Resolution : 1 micron
X,Y-Axis Accuracy(µm) : 2.5+L/200 um, L=measuring length (mm)
Repeatability : 0.003mm
Origin : Dongguan
HS Code : 9031809090
Port : Shenzhen, China
Wafer Inspecting Microscope Inspect500
Usage
INSPECT series measuring metallurgical microscope are widely used in semiconductor packages, solder pads, loop height, FPD panels (LCM), wafer level CSPS and so on.
Features & Advantages of Wafer Inspecting microscope
■ High-precision marble base, table and column to ensure high stability and rigidity
■ Marble table design, with precision V-shaped cross rail, ensure long-term use without deform, effectively guarantee high mechanical precision
■ High-quality optical system and high-resolution CCD ensure sharp image edges
■ Three-ring and eight-zone LED ring surface cold light source and contour light source, avoid the deformation of precision parts caused by the heat from light
■ Optional Nikon tilting trinocular tube + quintuple nosepiece
■ Independent research and development of image measuring software, powerful and easy to operate
Technical data
Model | INSPECT300 | INSPECT400 | INSPECT500 | ||||
X,Y axis travel(mm) | 300*200 | 400*300 | 500*400 | ||||
Stage glass size(mm) | 357*257 | 457*357 | 557*457 | ||||
Z axis travel(mm) | 100 | ||||||
X,Y,Z axis resolution (μm) | 1 | ||||||
Length unit | Linear scale | ||||||
Measuring accuracy (μm) | 2.5+L/150 L=measuring length (mm) | ||||||
Operation mode(X, Y) | Manual | ||||||
Operation mode(Z) | CNC | ||||||
Image system | High resolution CCD camera | ||||||
Quintuple nosepiece | 5X | 10X | 20X | 50X | |||
Eyepiece | WF10X | ||||||
Measuring software | 2D measuring software | ||||||
Illumination | Transmitted | Epi-illumination system | |||||
Contour | LED parallel contour light | ||||||
Power supply | AC100~240V 50/60Hz |
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1 Micron Large Travel 50X Wafer Inspection Microscope Images |